亚细胞分析

Low temperature scanning electron microscopy (Cryo-SEM) has become an established technique for capturing and observing biological samples close to their natural state. It is a method of choice, where the traditional sample preparation (e.g. critical point drying) causes unwanted changes in the sample structure. A Cryo-SEM workflow typically involves sample fixation using either flash-freezing in a liquid nitrogen slush or high-pressure freezing. The frozen samples are then transferred under vacuum to a cryo sputter coater, where they are coated with a conductive layer of metals or carbon. Finally, the samples are inserted into a SEM chamber equipped with a cryo-stage and observed in high vacuum environment.

Performing scanning transmission electron microscopy (STEM) in a scanning electron microscope (SEM) is a popular technique for laboratories without transmission electron microscopy (TEM) capabilities. The new option for TESCAN STEM detector extends the imaging capabilities by simultaneous acquisition of multiple signals from transmitted and diffracted electrons including bright field, dark field and high angle dark field. The STEM analysis can be further supplemented with transmission EDX or EBSD microanalysis for receiving higher resolution, utilizing the available analytical techniques of the SEM.

Scanning transmission electron microscopy (STEM) has become a highly effective, easy-to-use technique for imaging biological thin sections (lamellae) in SEM. Multiple sample observation, automated stage navigation, and ultra-high resolution imaging make this technique an attractive solution for high-contrast observation of TEM sections with excellent results, and minimal operator’s time.